Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes
نویسندگان
چکیده
A new real time in-situ scattering method to study texture evolution kinetic is exposed. The technique is adapted from an existing set up used at the Institut Laue-Langevin neutron facility to check monochromators. It uses a white hard X ray beam and works in transmission geometry. The 2D detector allows to follow recrystallization phenomena. A study of the annealing behavior of copper-nickel alloy rolled tapes, used as substrate for high temperature superconductor, is presented. hard X-rays; diffraction; in-situ; annealing; recrystallization; CuNi 61.66.Dk / 61.10.Eq 61.18.-j / 81.05.Bx / 81.40.Ef
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